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Characterization of the a-Si:H/c-Si interface by capacitance spectroscopy measurements: modeling and experiments

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00710779
Contributor : Olivier Schneegans <>
Submitted on : Thursday, June 21, 2012 - 3:53:42 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:17 PM

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  • HAL Id : hal-00710779, version 1

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Olga Maslova, Aurore Brézard, Wilfried Favre, José Alvarez, A.S. Gudovskikh, et al.. Characterization of the a-Si:H/c-Si interface by capacitance spectroscopy measurements: modeling and experiments. E-MRS Fall Meeting 2011, Sep 2011, Varsovie, Poland. ⟨hal-00710779⟩

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