Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers

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https://hal-supelec.archives-ouvertes.fr/hal-00710780
Contributor : Olivier Schneegans <>
Submitted on : Thursday, June 21, 2012 - 3:53:51 PM
Last modification on : Wednesday, October 23, 2019 - 11:14:03 PM

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  • HAL Id : hal-00710780, version 1

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Wilfried Favre, Laroussi Bettaieb, J. Després, José Alvarez, Jean-Paul Kleider, et al.. Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers. 26th EU PVSEC, Sep 2011, Hambourg, Germany. ⟨hal-00710780⟩

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