Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00710790
Contributor : Olivier Schneegans <>
Submitted on : Thursday, June 21, 2012 - 3:54:26 PM
Last modification on : Wednesday, September 18, 2019 - 4:49:21 PM

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  • HAL Id : hal-00710790, version 1

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Morgane Fruzzetti, José Alvarez, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, et al.. Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires. Journées Nationales PhotoVoltaïques 2011, Dec 2011, Dourdan, France. ⟨hal-00710790⟩

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