Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires

Morgane Fruzzetti 1 José Alvarez 1 Irène Ngo 1 Marie-Estelle Gueunier-Farret 1 Jean-Paul Kleider 1 Lianbo Yu Pere Roca I Cabarrocas Christine Morin 2 Simon Perraud
1 SCM - Equipe Semiconducteurs en Couches Minces
LGEP - Laboratoire de génie électrique de Paris
2 LITEN - Laboratoire d'Innovation pour les Technologies des Energies Nouvelles et les nanomatériaux
Document type :
Conference papers
Complete list of metadatas
https://hal-supelec.archives-ouvertes.fr/hal-00710790
Contributor : Olivier Schneegans <>
Submitted on : Thursday, June 21, 2012 - 3:54:26 PM
Last modification on : Wednesday, October 23, 2019 - 11:14:03 PM

Identifiers

  • HAL Id : hal-00710790, version 1

Collections

CNRS | SUPELEC | UPMC | CEA | DRT | UNIV-SAVOIE | UGA | SUP_LGEP | SUP_SCM | LITEN | SORBONNE-UNIVERSITE | CEA-GRE

Citation

Morgane Fruzzetti, José Alvarez, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, et al.. Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires. Journées Nationales PhotoVoltaïques 2011, Dec 2011, Dourdan, France. ⟨hal-00710790⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

513

Contact

Informations

CCSD