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Conference papers

Crystal quality characterization of MO-VPE InxGa1-xN thin films using disorder parameters

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https://hal-supelec.archives-ouvertes.fr/hal-00710795
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Thursday, June 21, 2012 - 3:54:47 PM
Last modification on : Tuesday, November 16, 2021 - 5:20:35 AM

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  • HAL Id : hal-00710795, version 1

Citation

Vanessa Gorge, Anne Migan-Dubois, Christelle Pareige, Zakaria Djebbour, K. Pantzas, et al.. Crystal quality characterization of MO-VPE InxGa1-xN thin films using disorder parameters. E-MRS Spring Meeting 2011, May 2011, Nice, France. ⟨hal-00710795⟩

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