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Crystal quality characterization of MO-VPE InxGa1-xN thin films using disorder parameters

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00710795
Contributor : Olivier Schneegans <>
Submitted on : Thursday, June 21, 2012 - 3:54:47 PM
Last modification on : Monday, November 30, 2020 - 11:20:04 AM

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  • HAL Id : hal-00710795, version 1

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Vanessa Gorge, Anne Migan-Dubois, Christelle Pareige, Zakaria Djebbour, K. Pantzas, et al.. Crystal quality characterization of MO-VPE InxGa1-xN thin films using disorder parameters. E-MRS Spring Meeting 2011, May 2011, Nice, France. ⟨hal-00710795⟩

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