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Improvement of electrical contacts reliability in a magnetic MEMS switch

C. Poulain M. Vincent L. Chiesi J. Delamarre Frédéric Houzé 1 H. Sibuet
1 CE - Equipe Contacts Electriques
LGEP - Laboratoire de génie électrique de Paris
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https://hal-supelec.archives-ouvertes.fr/hal-00715286
Contributor : Olivier Schneegans <>
Submitted on : Friday, July 6, 2012 - 4:01:08 PM
Last modification on : Thursday, June 17, 2021 - 3:46:12 AM

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  • HAL Id : hal-00715286, version 1

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CNRS | SUPELEC | UPMC | SUP_LGEP | SUP_CE | SORBONNE-UNIVERSITE | EC-PARIS

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C. Poulain, M. Vincent, L. Chiesi, J. Delamarre, Frédéric Houzé, et al.. Improvement of electrical contacts reliability in a magnetic MEMS switch. Failure analysis - A practical guide for manufacturers of electronic components and systems, John Wiley & Sons Ltd, pp.270-274, 2011. ⟨hal-00715286⟩

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