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An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy

Abstract : An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy has been presented. The system utilises two-dimensional analysis of the photocurrent transients digitally recorded in a broad range of temperatures for determination of defect centers parameters and a simulation procedure for calculation their concentration. The system is shown to be a powerful tool for studies of defect structure of high-resistivity semiconductors.
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https://hal-supelec.archives-ouvertes.fr/hal-00763193
Contributor : Olivier Schneegans <>
Submitted on : Monday, December 10, 2012 - 11:55:33 AM
Last modification on : Wednesday, October 21, 2020 - 2:01:25 PM

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  • HAL Id : hal-00763193, version 1

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M. Suproniuk, P. Kaminski, M. Miczuga, M. Pawlowski, R. Kozlowski, et al.. An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy. Przeglad Elektrotechniczny , Wydawnictwo Czasopism i Ksia̜żek Technicznych Sigma, 2009, pp.93-98. ⟨hal-00763193⟩

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