An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy

M. Suproniuk , P. Kaminski , M. Miczuga , M. Pawlowski , R. Kozlowski , Christophe Longeaud (1) , Jean-Paul Kleider (1)

1 LGEP - Laboratoire de génie électrique de Paris

An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy has been presented. The system utilises two-dimensional analysis of the photocurrent transients digitally recorded in a broad range of temperatures for determination of defect centers parameters and a simulation procedure for calculation their concentration. The system is shown to be a powerful tool for studies of defect structure of high-resistivity semiconductors.

M. Suproniuk, P. Kaminski, M. Miczuga, M. Pawlowski, R. Kozlowski, et al.. An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy. Przeglad Elektrotechniczny , 2009, 11/2009, pp.93-98. ⟨hal-00763193⟩