Skip to Main content Skip to Navigation
Conference papers

ECT simulation of complex narrow cracks in planar multi-layered structures

Abstract : A fast simulation tool of Eddy Current Testing (ECT) inspections, based on a Boundary Element Method (BEM), is proposed in this paper. Simulated signals consist in impedance variation of a coil due to multiple narrow cracks located in conductive planar multilayered structures (MLS). The cracks can have various shapes or orientations and can lie in any layers of the structure inspected. After a presentation of the method, validations results, consisting in comparison of simulated signals with experimental data and results obtained with finite element calculations, are presented. In all the problems tested, a very good accuracy and a very low computation time have been observed. Further perspective and conclusions of this work are detailed at the end of the paper.
Document type :
Conference papers
Complete list of metadata
Contributor : Dominique Lesselier Connect in order to contact the contributor
Submitted on : Tuesday, December 18, 2012 - 2:14:16 PM
Last modification on : Monday, December 13, 2021 - 9:16:03 AM


  • HAL Id : hal-00766538, version 1



Roberto Miorelli, Christophe Reboud, Dominique Lesselier, Nikolaos Poulakis, Theodoros Theodoulidis. ECT simulation of complex narrow cracks in planar multi-layered structures. 17th International Workshop on Electromagnetic Non-Destructive Evaluation, Jul 2012, Rio de Janeiro, Brazil. pp.ENDE Abstracts. ⟨hal-00766538⟩



Les métriques sont temporairement indisponibles