Skip to Main content Skip to Navigation
Conference papers

Electrical characterization and modeling of the amorphous/crystalline silicon interface

Document type :
Conference papers
Complete list of metadatas

https://hal-supelec.archives-ouvertes.fr/hal-00778999
Contributor : Olivier Schneegans <>
Submitted on : Monday, January 21, 2013 - 3:57:52 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:22 PM

Identifiers

  • HAL Id : hal-00778999, version 1

Citation

Jean-Paul Kleider, Renaud Varache, Wilfried Favre, Olga Maslova, José Alvarez, et al.. Electrical characterization and modeling of the amorphous/crystalline silicon interface. E-MRS 2012 Spring Meeting, May 2012, Strasbourg, France. ⟨hal-00778999⟩

Share

Metrics

Record views

95