Modeling of thin conductive and magnetic layers in eddy current testing by overlapping finite elements

Abstract : In this paper a new field of application of the overlapping finite element method is proposed for eddy current testing. This method, which has already been used to deal with the lift-off, is extended to the treatment of thin conducting and/or magnetic layers.
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Submitted on : Tuesday, January 22, 2013 - 12:27:21 PM
Last modification on : Thursday, December 13, 2018 - 1:32:22 AM

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Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Modeling of thin conductive and magnetic layers in eddy current testing by overlapping finite elements. International Journal of Applied Electromagnetics and Mechanics, IOS Press 2012, 39 (1-4), pp.341-346. ⟨10.3233/JAE-2012-1480⟩. ⟨hal-00779505⟩

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