J. Heckel, Smart substation and feeder automation for a smart distribution grid, IET Conference Publications, 2002.
DOI : 10.1049/cp.2009.0942

M. Granger-morgan, J. Apt, L. Lave, M. Ilic, M. Sirbu et al., The many meanings of Smart Grid. A Briefing Note from the Department of Engineering and Public Policy, 2009.

H. Hajian-hoseinabadi, Reliability and component importance analysis of substation automation systems, International Journal of Electrical Power & Energy Systems, vol.49
DOI : 10.1016/j.ijepes.2010.06.012

T. Daemi, A. Ebrahimi, and M. Fotuhi-firuzabad, Constructing the Bayesian Network for components reliability importance ranking in composite power systems, International Journal of Electrical Power & Energy Systems, vol.43, issue.1, pp.474-480, 2012.
DOI : 10.1016/j.ijepes.2012.06.010

M. Farhoodnea, A. Mohamed, H. Shareef, X. Tan, Q. Li et al., Identification of multiple harmonic sources in power systems using independent component analysis and mutual information Advances and trends of energy storage technology in Microgrid, International Journal of Engineering Intelligent Systems International Journal of Electrical Power & Energy Systems, vol.18447, issue.11, pp.51-63179, 2010.

L. Chang and Z. Wu, Performance and reliability of electrical power grids under cascading failures, International Journal of Electrical Power & Energy Systems, vol.33, issue.8, pp.1410-1419, 2011.
DOI : 10.1016/j.ijepes.2011.06.021

L. Arya, S. Choube, and R. Arya, Probabilistic reliability indices evaluation of electrical distribution system accounting outage due to overloading and repair time omission, International Journal of Electrical Power & Energy Systems, vol.33, issue.2, pp.296-302, 2011.
DOI : 10.1016/j.ijepes.2010.08.025

V. Sood, D. Fischer, J. Eklund, and T. Brown, Developing a communication infrastructure for the Smart Grid, 2009 IEEE Electrical Power & Energy Conference (EPEC)
DOI : 10.1109/EPEC.2009.5420809

M. Ili?, L. Xie, U. Khan, and J. Moura, Modeling of future cyber?physical energy systems for distributed sensing and control, IEEE Trans. Syst. Man Cybern. A, Syst. Humans, vol.4012, issue.4, pp.825-863, 2010.

P. Ren, Z. Xiang, and Z. Qiu, Intelligent domestic electricity management system based on analog-distributed hierarchy, International Journal of Electrical Power & Energy Systems, vol.46, issue.0, pp.400-404, 2013.
DOI : 10.1016/j.ijepes.2012.10.045

H. Farhangi, The path of the smart grid, IEEE Power and Energy Magazine, vol.8, issue.1, pp.18-28, 2010.
DOI : 10.1109/MPE.2009.934876

V. Gungor, D. Sahin, T. Kocak, S. Ergut, C. Buccella et al., Smart Grid Technologies: Communication Technologies and Standards, IEEE Transactions on Industrial Informatics, vol.7, issue.4, pp.529-568, 2011.
DOI : 10.1109/TII.2011.2166794

S. Depuru, L. Wang, and V. Devabhaktuni, Smart meters for power grid: challenges, issues, advantages and status

B. Kalinowski and G. Anders, A new look at component maintenance practices and their effect on customer, station and system reliability, 17] Reliability Prediction Procedure for Electronic Equipment. AMSC MIL-HDBK-217F, pp.679-95, 1991.
DOI : 10.1016/j.ijepes.2006.03.023

J. Bowles, A survey of reliability-prediction procedures for microelectronic devices, IEEE Transactions on Reliability, vol.41, issue.1, pp.2-12, 1992.
DOI : 10.1109/24.126662

J. Jones and J. Hayes, A comparison of electronic-reliability prediction models, IEEE Transactions on Reliability, vol.48, issue.2, pp.127-161, 1999.
DOI : 10.1109/24.784270

M. Cushing, D. Mortin, T. Stadterman, and A. Malhotra, Comparison of electronics-reliability assessment approaches, IEEE Transactions on Reliability, vol.42, issue.4, pp.542-588, 1993.
DOI : 10.1109/24.273574

W. Meeker, L. Escobar, and C. Lu, Accelerated Degradation Tests: Modeling and Analysis, Technometrics, vol.46, issue.1, pp.89-99, 1998.
DOI : 10.1080/00401706.1998.10485191

V. Oliveira and E. Colosimo, Comparison of Methods to Estimate the Time-to-failure Distribution in Degradation Tests, Quality and Reliability Engineering International, vol.20, issue.4
DOI : 10.1002/qre.567

X. Si, W. Wang, C. Hu, D. Zhou, and M. Pecht, Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process, IEEE Transactions on Reliability, vol.61, issue.1, pp.50-67, 2012.
DOI : 10.1109/TR.2011.2182221

W. Wondrak, Physical limits and lifetime limitations of semiconductor devices at high temperatures. Microelectronics Reliability, pp.6-71113, 1999.

H. Lu, C. Bailey, and C. Yin, Design for reliability of power electronics modules, Microelectronics Reliability, vol.49, issue.9-11, pp.9-11, 2009.
DOI : 10.1016/j.microrel.2009.07.055

W. Roesch, Historical review of compound semiconductor reliability, Microelectronics Reliability, vol.46, issue.8, pp.1218-127, 2006.
DOI : 10.1016/j.microrel.2006.02.008

W. Kolarik, Creating quality: concepts, systems, strategies, and tools. McGraw-Hill College, 1995.

C. Vournas, P. Sauer, and M. Pai, Relationships between voltage and angle stability of power systems, International Journal of Electrical Power & Energy Systems, vol.18, issue.8, pp.493-493, 1996.
DOI : 10.1016/0142-0615(96)00009-9

E. Alessio, A. Carbone, G. Castelli, and V. Frappietro, Second-order moving average and scaling of stochastic time series, The European Physical Journal B - Condensed Matter, vol.27, issue.2, pp.197-197, 2002.
DOI : 10.1140/epjb/e20020150

N. Vandewalle and M. Ausloos, Crossing of two mobile averages: A method for measuring the roughness exponent, Physical Review E, vol.58, issue.5
DOI : 10.1103/PhysRevE.58.6832

W. Nelson, Accelerated testing: statistical models, test plans and data analyses Wiley Online Library, 1990.
DOI : 10.1002/9780470316795

L. Escobar and W. Meeker, A Review of Accelerated Test Models, Statistical Science, vol.21, issue.4, pp.552-77, 2006.
DOI : 10.1214/088342306000000321

K. Striny and A. Schelling, Reliability Evaluation of Aluminum-Metallized MOS Dynamic RAM's in Plastic Packages in High Humidity and Temperature Environments, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol.4, issue.4, pp.476-81, 1981.
DOI : 10.1109/TCHMT.1981.1135819

R. Littell, J. Mcclave, and W. Offen, Goodness-of-fit tests for the two parameter Weibull distribution, Communications in Statistics - Simulation and Computation, vol.11, issue.3, pp.257-69, 1979.
DOI : 10.1080/03610917908812118