Coupled approach VIM-BEM for efficient modeling of ECT signal due to narrow cracks and volumetric flaws in planar layered media

Roberto Miorelli 1 Christophe Reboud 1 Theodoros Theodoulidis 2 John Martinos 3 Nikolaos Poulakis 2 Dominique Lesselier 4
1 DISC - Département Imagerie et Simulation pour le Contrôle
2 MEANDER
Department of Mechanical Engineering
3 Department of Mechanical Engineering
4 DRE - Département de Recherche en Electromagnétisme ; EMG - Département Electromagnétisme - L2S
L2S - Laboratoire des signaux et systèmes : 1289, SUPELEC-Campus Gif
Abstract : Rapid and accurate modeling of Eddy Current Testing (ECT) signal is required in many industrial areas. For example, crack detection via ECT is widely employed in aeronautics and aerospace industry to inspect riveted planar multilayered structures. In these structures, small narrow cracks (e.g. micro-cracks) may initiate at the edge of rivet holes (which can be considered as large volumetric flaws) and propagate through the PMS. This article proposes a new and efficient model, based on a coupled approach between Volume Integral Method (VIM) and Boundary Element Method (BEM), simulating ECT probe signals due to the presence of both narrow cracks located near volumetric flaws within a given PMS. Simulation results are compared with experimental and simulated signals obtained with a numerical code. The performance of the method, in terms of accuracy and computational time, is discussed and the perspectives opened are presented.
Keywords : Narrow crack Fasteners inspection Eddy current testing Spatial-domain dyadic Green function Multilayered medium Coupled integral equations
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Journal articles
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https://hal-supelec.archives-ouvertes.fr/hal-00927173
Contributor : Dominique Lesselier <>
Submitted on : Saturday, January 11, 2014 - 5:02:17 PM
Last modification on : Wednesday, April 17, 2019 - 6:00:07 PM

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Roberto Miorelli, Christophe Reboud, Theodoros Theodoulidis, John Martinos, Nikolaos Poulakis, et al.. Coupled approach VIM-BEM for efficient modeling of ECT signal due to narrow cracks and volumetric flaws in planar layered media. NDT and E International, Elsevier, 2014, 62, pp.178-183. ⟨10.1016/j.ndteint.2013.12.013⟩. ⟨hal-00927173⟩

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