Amorphous Y-Ba-Cu-O oxide thin films grown on silicon substrates: optical properties and infrared sensor characterization for future THz imagers

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https://hal-supelec.archives-ouvertes.fr/hal-00931072
Contributor : Thierry Leblanc <>
Submitted on : Tuesday, January 14, 2014 - 7:23:56 PM
Last modification on : Thursday, March 21, 2019 - 1:00:49 PM

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  • HAL Id : hal-00931072, version 1

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Alain Kreisler, Xavier Galiano, Vishal Jagtap, Annick Dégardin. Amorphous Y-Ba-Cu-O oxide thin films grown on silicon substrates: optical properties and infrared sensor characterization for future THz imagers. Conference of the European Materials Science Society (E-MRS 2013), May 2013, Strasbourg, France. ⟨hal-00931072⟩

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