Characterization of the III-V/Ge interface by capacitance measurements for III-V multijunction solar cells development

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https://hal-supelec.archives-ouvertes.fr/hal-00931315
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Submitted on : Wednesday, January 15, 2014 - 11:29:53 AM
Last modification on : Wednesday, October 23, 2019 - 11:14:03 PM

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  • HAL Id : hal-00931315, version 1

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K. S. Zelentsov, A.S. Gudovskikh, N.A. Kalyuzhnyy, V.M. Lantratov, S.A. Mintairov, et al.. Characterization of the III-V/Ge interface by capacitance measurements for III-V multijunction solar cells development. E-MRS Spring Meeting 2013, May 2013, Strasbourg, France. ⟨hal-00931315⟩

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