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a-Si:H/c-Si heterojunction interface properties from Hall measurements of surface inversion layer

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https://hal-supelec.archives-ouvertes.fr/hal-01099577
Contributor : Thierry Leblanc <>
Submitted on : Sunday, January 4, 2015 - 6:58:18 PM
Last modification on : Wednesday, September 16, 2020 - 4:42:49 PM

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  • HAL Id : hal-01099577, version 1

Citation

Alexander Gudovskikh, E.V. Nikitina, Jean-Paul Kleider. a-Si:H/c-Si heterojunction interface properties from Hall measurements of surface inversion layer. E-MRS Spring Meeting 2014, European Materials Research Society, May 2014, Lille, France. ⟨hal-01099577⟩

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