José Alvarez, M. Boutchich, Jean-Paul Kleider, T. Teraji, Y. Koide. Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging.
Journal of Physics D: Applied Physics, IOP Publishing, 2014, 47 (35), pp.355102.
⟨10.1088/0022-3727/47/35/355102⟩.
⟨hal-01099593⟩