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ECOLE SUPÉRIEURE D'ÉLECTRICITÉ Une grande école d'ingénieurs au cœur des sciences de l'information,de l'énergie et des systèmes |
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Conference papers
Characterization of a 3D defect using the Expected Improvement algorithm
Abstract : This paper provides a new methodology for the characterization of a defect embedded in a conductive nonmagnetic plate from the measurement of the impedance variations of an air-cored pancake coil at eddy current frequencies. The inversion problem is dealt with using the Expected Improvement (EI) global optimization algorithm. The efficiency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data.
https://hal-supelec.archives-ouvertes.fr/hal-01104089
Contributor : Karine El Rassi Connect in order to contact the contributor
Submitted on : Monday, January 19, 2009 - 4:26:30 PM
Last modification on : Thursday, June 17, 2021 - 3:48:27 AM
Long-term archiving on: : Tuesday, June 8, 2010 - 8:47:21 PM
Contributor : Karine El Rassi Connect in order to contact the contributor
Submitted on : Monday, January 19, 2009 - 4:26:30 PM
Last modification on : Thursday, June 17, 2021 - 3:48:27 AM
Long-term archiving on: : Tuesday, June 8, 2010 - 8:47:21 PM
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BiliczIGTE-2008-full_final.pdf
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