Characterization of a 3D defect using the Expected Improvement algorithm

Sandor Bilicz 1, 2 Emmanuel Vazquez 3, 4 Marc Lambert 2 Szabolcs Gyimothy 1 Jozsef Pavo 1
1 BME - Budapest University of Technology and Economics [Budapest]
2 L2S - Laboratoire des signaux et systèmes
3 E3S - Supélec Sciences des Systèmes [Gif-sur-Yvette]
4 GdR MASCOT-NUM - Méthodes d'Analyse Stochastique des Codes et Traitements Numériques
Abstract : This paper provides a new methodology for the characterization of a defect embedded in a conductive non-magnetic plate from the measurement of the impedance vari-ations of an air-cored pancake coil at eddy current frequen-cies. The inversion problem is dealt with using the Expected Improvement (EI) global optimization algorithm. The effi-ciency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data.
Keywords : ENDE inverse problem re-sponse surface global optimization
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-01104089
Contributor : Marc Lambert <>
Submitted on : Friday, January 16, 2015 - 10:11:26 AM
Last modification on : Thursday, April 5, 2018 - 12:30:05 PM
Long-term archiving on : Friday, September 11, 2015 - 6:53:56 AM

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Sandor Bilicz, Emmanuel Vazquez, Marc Lambert, Szabolcs Gyimothy, Jozsef Pavo. Characterization of a 3D defect using the Expected Improvement algorithm. IGTE 2008, Sep 2008, Graz, Austria. ⟨hal-01104089⟩

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