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Characterization of a 3D defect using the Expected Improvement algorithm

Abstract : This paper provides a new methodology for the characterization of a defect embedded in a conductive non-magnetic plate from the measurement of the impedance vari-ations of an air-cored pancake coil at eddy current frequen-cies. The inversion problem is dealt with using the Expected Improvement (EI) global optimization algorithm. The effi-ciency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data.
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Contributor : Marc Lambert Connect in order to contact the contributor
Submitted on : Friday, January 16, 2015 - 10:11:26 AM
Last modification on : Wednesday, January 13, 2021 - 1:52:03 PM
Long-term archiving on: : Friday, September 11, 2015 - 6:53:56 AM


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  • HAL Id : hal-01104089, version 1


Sandor Bilicz, Emmanuel Vazquez, Marc Lambert, Szabolcs Gyimothy, Jozsef Pavo. Characterization of a 3D defect using the Expected Improvement algorithm. IGTE 2008, Sep 2008, Graz, Austria. ⟨hal-01104089v1⟩



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