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Characterization of a 3D defect using the Expected Improvement algorithm

Abstract : This paper provides a new methodology for the characterization of a defect embedded in a conductive nonmagnetic plate from the measurement of the impedance variations of an air-cored pancake coil at eddy current frequencies. The inversion problem is dealt with using the Expected Improvement (EI) global optimization algorithm. The efficiency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data.
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Submitted on : Monday, January 19, 2009 - 4:26:30 PM
Last modification on : Thursday, June 17, 2021 - 3:48:27 AM
Long-term archiving on: : Tuesday, June 8, 2010 - 8:47:21 PM


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  • HAL Id : hal-01104089, version 2



S. Bilicz, Emmanuel Vazquez, Marc Lambert, S. Gyimothy, J. Pavo. Characterization of a 3D defect using the Expected Improvement algorithm. 13th IGTE - Symposium on Numerical Field Calculation in Electrical Engineering, Sep 2008, Graz, Austria. ⟨hal-01104089v2⟩



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